Welcome to the official website of Junsheng Testing！
- Transmit power Power spectral density Take up time Duty cycle Adaptive Channel spacing Occupying bandwidth Frequency stability Modulation bandwidth Emission spur In-band spurs Dynamic frequency selection Receive spurious Sensitivity Peak power to average power ratio Receive blocking and bit error rate Electromagnetic field
RF Wireless Testing
- Radiation (RE) 10m Radiation (RE) 3m Radiated Immunity (RS) Radiated spurious (RSE) Conduction (CE) Conducted Immunity (CS) Disturbance power (DP) Three loop antenna (3Loop) Lightning strike (SURGE) Static electricity (ESD) Electrical Fast Transient (EFT) Dips & Interruptions (DIP) Harmonic Flicker (H&F) Power frequency magnetic field (MS) Clicking sound (Click)
EMC Testing
Contact information
Free service hotline
Tel：188-2379-9985
Email：info@jtl-lab.org
Address：Area 2-1102D, Building T2, Haigu Science and Technology Building, Shiyan Street, Bao'an District, Shenzhen
